Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov, Yoni Toker, Oded Heber, Daniel Strasser, Michael Rappaport, Dirk Schwalm, Daniel Zajfman

פרסום מחקרי: פרסום בכתב עתסקירהביקורת עמיתים


A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

שפה מקוריתאנגלית
מספר המאמר033302
כתב עתReview of Scientific Instruments
מספר גיליון3
מזהי עצם דיגיטלי (DOIs)
סטטוס פרסוםפורסם - מרץ 2012

הערה ביבליוגרפית

Funding Information:
This work was supported by the Israel Science Foundation (Grant No. 1242/09) and by Research Grant from Estate of David Turner and by YEDA in collaboration with ABSciex. D. Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program. D. St. acknowledges support from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement No. 247471.

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