Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov; Yoni Toker; Oded Heber; Daniel Strasser; Michael Rappaport; Dirk Schwalm; Daniel Zajfman

doi:10.1063/1.3694997

Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov, Yoni Toker, Oded Heber, Daniel Strasser, Michael Rappaport, Dirk Schwalm, Daniel Zajfman

כימיה

פרסום מחקרי: פרסום בכתב עת › סקירה › ביקורת עמיתים

תקציר

A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

שפה מקורית	אנגלית
מספר המאמר	033302
כתב עת	Review of Scientific Instruments
כרך	83
מספר גיליון	3
מזהי עצם דיגיטלי (DOIs)	https://doi.org/10.1063/1.3694997
סטטוס פרסום	פורסם - מרץ 2012

הערה ביבליוגרפית

Funding Information:
This work was supported by the Israel Science Foundation (Grant No. 1242/09) and by Research Grant from Estate of David Turner and by YEDA in collaboration with ABSciex. D. Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program. D. St. acknowledges support from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement No. 247471.

גישה למסמך

10.1063/1.3694997

קבצים וקישורים אחרים

Link to publication in Scopus

פורמט ציטוט ביבליוגרפי

@article{ac76d2799d7d44b69fe63c77f76bdf2a,

title = "Lifetime measurements in an electrostatic ion beam trap using image charge monitoring",

abstract = "A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.",

author = "Igor Rahinov and Yoni Toker and Oded Heber and Daniel Strasser and Michael Rappaport and Dirk Schwalm and Daniel Zajfman",

year = "2012",

month = mar,

doi = "10.1063/1.3694997",

language = "אנגלית",

volume = "83",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "3",

}

TY - JOUR

T1 - Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

AU - Rahinov, Igor

AU - Toker, Yoni

AU - Heber, Oded

AU - Strasser, Daniel

AU - Rappaport, Michael

AU - Schwalm, Dirk

AU - Zajfman, Daniel

PY - 2012/3

Y1 - 2012/3

N2 - A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

AB - A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

UR - http://www.scopus.com/inward/record.url?scp=84861580833&partnerID=8YFLogxK

U2 - 10.1063/1.3694997

DO - 10.1063/1.3694997

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.systematicreview???

AN - SCOPUS:84861580833

SN - 0034-6748

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

M1 - 033302

ER -

Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

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