תקציר
Generative machine unlearning has emerged as a critical requirement for the responsible deployment of text-to-image generative models, where the ability to erase specific visual concepts is essential for addressing concerns of privacy, copyright, and ethical use. Despite rapid progress in generative modeling, the field lacks standardized benchmarks to evaluate how effectively models can forget targeted concepts while retaining adjacent and unrelated knowledge. To fill this gap, we introduce the Genμ benchmark, which provides an extensive dataset of target, retain, and adjacent concepts, coupled with carefully engineered and adversarial prompts designed to probe unlearning robustness. To ensure fair and comprehensive assessment, we utilize the Erasing-Retention-Robustness score, a unified metric for capturing erasing accuracy, retention accuracy, adjacent-concept preservation, engineered-prompt robustness, and adversarial robustness. Alongside this benchmark, we establish detailed baselines using widely adopted unlearning algorithms, demonstrating the strengths and limitations of current approaches. By consolidating tasks such as single-concept, multi-concept, and continuous unlearning in a unified framework, the Genμ benchmark provides the first rigorous foundation for systematic evaluation in this domain. It aims to catalyze future research on controllable and responsible generative models that can selectively forget while preserving generality and robustness.
| שפה מקורית | אנגלית |
|---|---|
| כותר פרסום המארח | Proceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 |
| מוציא לאור | Institute of Electrical and Electronics Engineers Inc. |
| עמודים | 2554-2562 |
| מספר עמודים | 9 |
| מסת"ב (אלקטרוני) | 9798331589882 |
| מזהי עצם דיגיטלי (DOIs) | |
| סטטוס פרסום | פורסם - 2025 |
| פורסם באופן חיצוני | כן |
| אירוע | 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 - Honolulu, ארצות הברית משך הזמן: 19 אוק׳ 2025 → 20 אוק׳ 2025 |
סדרות פרסומים
| שם | Proceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 |
|---|
כנס
| כנס | 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 |
|---|---|
| מדינה/אזור | ארצות הברית |
| עיר | Honolulu |
| תקופה | 19/10/25 → 20/10/25 |
הערה ביבליוגרפית
Publisher Copyright:© 2025 IEEE.
טביעת אצבע
להלן מוצגים תחומי המחקר של הפרסום 'Genμ: The Generative Machine Unlearning Challenge'. יחד הם יוצרים טביעת אצבע ייחודית.פורמט ציטוט ביבליוגרפי
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