תקציר
A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.
שפה מקורית | אנגלית |
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עמודים | 177 |
מספר עמודים | 1 |
מזהי עצם דיגיטלי (DOIs) | |
סטטוס פרסום | פורסם - 1996 |
פורסם באופן חיצוני | כן |
אירוע | Proceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing - Philadelphia, PA, USA משך הזמן: 23 מאי 1996 → 26 מאי 1996 |
כנס
כנס | Proceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing |
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עיר | Philadelphia, PA, USA |
תקופה | 23/05/96 → 26/05/96 |