TY - JOUR
T1 - Using measurements with large round-off errors for interval estimation of normal process variance
AU - Diamanta, Benson Karhi
AU - Ellite, Dvir Harcabi
AU - Regev, Itai
AU - Edna, Schechtman
N1 - Publisher Copyright:
© 2015. The Institution of Engineering and Technology.
PY - 2015/11/1
Y1 - 2015/11/1
N2 - Large round-off errors may affect efforts to estimate the distribution parameters. The ratio between the standard deviation σ and the scale step h, δ = σ/h, of the measurement instrument, for which rounding off is large when δ < 0.5, determines the significance of the round off. In this study the authors present a new variance interval estimator based on the method of moments (MoM) approach using the bootstrap technique. The authors compare the MoM interval estimator with two a-parametric estimators, the naïve estimator and Sheppard's correction, using simulation. They find that the MoM interval estimator performs better than the a-parametric estimators in terms of coverage probability and interval length, especially for medium and large samples. The MoM interval estimator should be used to compensate for the large round off errors that can occur when using measurement instruments whose scale step is too large.
AB - Large round-off errors may affect efforts to estimate the distribution parameters. The ratio between the standard deviation σ and the scale step h, δ = σ/h, of the measurement instrument, for which rounding off is large when δ < 0.5, determines the significance of the round off. In this study the authors present a new variance interval estimator based on the method of moments (MoM) approach using the bootstrap technique. The authors compare the MoM interval estimator with two a-parametric estimators, the naïve estimator and Sheppard's correction, using simulation. They find that the MoM interval estimator performs better than the a-parametric estimators in terms of coverage probability and interval length, especially for medium and large samples. The MoM interval estimator should be used to compensate for the large round off errors that can occur when using measurement instruments whose scale step is too large.
UR - http://www.scopus.com/inward/record.url?scp=84948669441&partnerID=8YFLogxK
U2 - 10.1049/iet-smt.2014.0262
DO - 10.1049/iet-smt.2014.0262
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AN - SCOPUS:84948669441
SN - 1751-8822
VL - 9
SP - 1050
EP - 1056
JO - IET Science, Measurement and Technology
JF - IET Science, Measurement and Technology
IS - 8
ER -