TY - JOUR
T1 - Particle-in-cell techniques for the study of space charge effects in an electrostatic ion beam trap
AU - Gupta, Dhanoj
AU - Singh, Raj
AU - Ringle, Ryan
AU - Nicoloff, Catherine R.
AU - Rahinov, Igor
AU - Heber, Oded
AU - Zajfman, Daniel
N1 - Publisher Copyright:
© 2021 American Physical Society.
PY - 2021/12
Y1 - 2021/12
N2 - We developed a simulation technique to study the effect of space charge interaction between trapped ions in the electrostatic ion beam trap (EIBT). The importance of space charge is demonstrated in both the dispersive and the self-bunching regime of the ion trap. The simulation results provide an estimate for the space charge effect on the trapping efficiency. They also allow for a better understanding of the enhanced diffusion and the self-bunching effect and provide a better characterization of the EIBT as a mass spectrometer, where peak coalescence is important. The numerical results reproduce all experimental data, demonstrating the critical importance of including space charge effects, even at low ion density, to understand the ion trap dynamics.
AB - We developed a simulation technique to study the effect of space charge interaction between trapped ions in the electrostatic ion beam trap (EIBT). The importance of space charge is demonstrated in both the dispersive and the self-bunching regime of the ion trap. The simulation results provide an estimate for the space charge effect on the trapping efficiency. They also allow for a better understanding of the enhanced diffusion and the self-bunching effect and provide a better characterization of the EIBT as a mass spectrometer, where peak coalescence is important. The numerical results reproduce all experimental data, demonstrating the critical importance of including space charge effects, even at low ion density, to understand the ion trap dynamics.
UR - http://www.scopus.com/inward/record.url?scp=85121603912&partnerID=8YFLogxK
U2 - 10.1103/PhysRevE.104.065202
DO - 10.1103/PhysRevE.104.065202
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C2 - 35030919
AN - SCOPUS:85121603912
SN - 2470-0045
VL - 104
JO - Physical Review E
JF - Physical Review E
IS - 6
M1 - 065202
ER -