Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov; Yoni Toker; Oded Heber; Daniel Strasser; Michael Rappaport; Dirk Schwalm; Daniel Zajfman

doi:10.1063/1.3694997

Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov, Yoni Toker, Oded Heber, Daniel Strasser, Michael Rappaport, Dirk Schwalm, Daniel Zajfman

Chemistry discipline

Research output: Contribution to journal › Review article › peer-review

Abstract

A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

Original language	English
Article number	033302
Journal	Review of Scientific Instruments
Volume	83
Issue number	3
DOIs	https://doi.org/10.1063/1.3694997
State	Published - Mar 2012

Bibliographical note

Funding Information:
This work was supported by the Israel Science Foundation (Grant No. 1242/09) and by Research Grant from Estate of David Turner and by YEDA in collaboration with ABSciex. D. Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program. D. St. acknowledges support from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement No. 247471.

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AU - Schwalm, Dirk

AU - Zajfman, Daniel

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Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Abstract

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