LATCH: Learned arrangements of three patch codes

Gil Levi, Tal Hassner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a novel means of describing local image appearances using binary strings. Binary descriptors have drawn increasing interest in recent years due to their speed and low memory footprint. A known shortcoming of these representations is their inferior performance compared to larger, histogram based descriptors such as the SIFT. Our goal is to close this performance gap while maintaining the benefits attributed to binary representations. To this end we propose the Learned Arrangements of Three Patch Codes descriptors, or LATCH. Our key observation is that existing binary descriptors are at an increased risk from noise and local appearance variations. This, as they compare the values of pixel pairs: changes to either of the pixels can easily lead to changes in descriptor values and compromise their performance. In order to provide more robustness, we instead propose a novel means of comparing pixel patches. This ostensibly small change, requires a substantial redesign of the descriptors themselves and how they are produced. Our resulting LATCH representation is rigorously compared to state-of-the-art binary descriptors and shown to provide far better performance for similar computation and space requirements.

Original languageEnglish
Title of host publication2016 IEEE Winter Conference on Applications of Computer Vision, WACV 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509006410
DOIs
StatePublished - 23 May 2016
EventIEEE Winter Conference on Applications of Computer Vision, WACV 2016 - Lake Placid, United States
Duration: 7 Mar 201610 Mar 2016

Publication series

Name2016 IEEE Winter Conference on Applications of Computer Vision, WACV 2016

Conference

ConferenceIEEE Winter Conference on Applications of Computer Vision, WACV 2016
Country/TerritoryUnited States
CityLake Placid
Period7/03/1610/03/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

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