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Genμ: The Generative Machine Unlearning Challenge

  • Kartik Thakral
  • , Shreyansh Pathak
  • , Tamar Glaser
  • , Tal Hassner
  • , Diego Garcia-Olano
  • , Iacopo Masi
  • , Richa Singh
  • , Mayank Vatsa

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Generative machine unlearning has emerged as a critical requirement for the responsible deployment of text-to-image generative models, where the ability to erase specific visual concepts is essential for addressing concerns of privacy, copyright, and ethical use. Despite rapid progress in generative modeling, the field lacks standardized benchmarks to evaluate how effectively models can forget targeted concepts while retaining adjacent and unrelated knowledge. To fill this gap, we introduce the Genμ benchmark, which provides an extensive dataset of target, retain, and adjacent concepts, coupled with carefully engineered and adversarial prompts designed to probe unlearning robustness. To ensure fair and comprehensive assessment, we utilize the Erasing-Retention-Robustness score, a unified metric for capturing erasing accuracy, retention accuracy, adjacent-concept preservation, engineered-prompt robustness, and adversarial robustness. Alongside this benchmark, we establish detailed baselines using widely adopted unlearning algorithms, demonstrating the strengths and limitations of current approaches. By consolidating tasks such as single-concept, multi-concept, and continuous unlearning in a unified framework, the Genμ benchmark provides the first rigorous foundation for systematic evaluation in this domain. It aims to catalyze future research on controllable and responsible generative models that can selectively forget while preserving generality and robustness.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2554-2562
Number of pages9
ISBN (Electronic)9798331589882
DOIs
StatePublished - 2025
Externally publishedYes
Event2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 - Honolulu, United States
Duration: 19 Oct 202520 Oct 2025

Publication series

NameProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
Country/TerritoryUnited States
CityHonolulu
Period19/10/2520/10/25

Bibliographical note

Publisher Copyright:
© 2025 IEEE.

Keywords

  • generative ai
  • machine unlearning
  • model editing

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