Few-shot Learning with Noisy Labels

Kevin J. Liang, Samrudhdhi B. Rangrej, Vladan Petrovic, Tal Hassner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Few-shot learning (FSL) methods typically assume clean support sets with accurately labeled samples when training on novel classes. This assumption can often be unrealistic: support sets, no matter how small, can still include mislabeled samples. Robustness to label noise is therefore essential for FSL methods to be practical, but this problem surprisingly remains largely unexplored. To address mislabeled samples in FSL settings, we make several technical contributions. (1) We offer simple, yet effective, feature aggregation methods, improving the prototypes used by ProtoNet, a popular FSL technique. (2) We describe a novel Transformer model for Noisy Few-Shot Learning (TraNFS). TraNFS leverages a transformer's attention mechanism to weigh mislabeled versus correct samples. (3) Finally, we extensively test these methods on noisy versions of MinilmageNet and TieredImageNet. Our results show that TraNFS is on-par with leading FSL methods on clean support sets, yet outperforms them, by far, in the presence of label noise.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages9079-9088
Number of pages10
ISBN (Electronic)9781665469463
DOIs
StatePublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • Transfer/low-shot/long-tail learning

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