Fast high dimensional vector multiplication face recognition

Oren Barkan, Jonathan Weill, Lior Wolf, Hagai Aronowitz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


This paper advances descriptor-based face recognition by suggesting a novel usage of descriptors to form an over-complete representation, and by proposing a new metric learning pipeline within the same/not-same framework. First, the Over-Complete Local Binary Patterns (OCLBP) face representation scheme is introduced as a multi-scale modified version of the Local Binary Patterns (LBP) scheme. Second, we propose an efficient matrix-vector multiplication-based recognition system. The system is based on Linear Discriminant Analysis (LDA) coupled with Within Class Covariance Normalization (WCCN). This is further extended to the unsupervised case by proposing an unsupervised variant of WCCN. Lastly, we introduce Diffusion Maps (DM) for non-linear dimensionality reduction as an alternative to the Whitened Principal Component Analysis (WPCA) method which is often used in face recognition. We evaluate the proposed framework on the LFW face recognition dataset under the restricted, unrestricted and unsupervised protocols. In all three cases we achieve very competitive results.

Original languageEnglish
Title of host publicationProceedings - 2013 IEEE International Conference on Computer Vision, ICCV 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages8
ISBN (Print)9781479928392
StatePublished - 2013
Externally publishedYes
Event2013 14th IEEE International Conference on Computer Vision, ICCV 2013 - Sydney, NSW, Australia
Duration: 1 Dec 20138 Dec 2013

Publication series

NameProceedings of the IEEE International Conference on Computer Vision


Conference2013 14th IEEE International Conference on Computer Vision, ICCV 2013
CitySydney, NSW


  • diffusion maps
  • dimensionality reduction
  • face recognition
  • high dimensional representation
  • overcomplete representation
  • pattern recognition
  • unsupervised labeling


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