TY - JOUR
T1 - Estimation of a normal process variance from measurements with large round-off errors
AU - Diamanta, Benson Karhi
AU - Ellite, Dvir Harcabi
AU - Itai, Regev
AU - Edna, Schechtman
PY - 2013
Y1 - 2013
N2 - Measurements are sometimes affected by excessively large round-off errors. Small rounding-off may safely be ignored for purposes of statistical inference however large rounding-off may have an effect. The importance of the round-off (δ) is determined by the ratio between the standard deviation s and the instrument's scale step h, δ = σ/h. In this study, the authors estimate σ when δ is small (δ < 0.5) using a variant of the method of moments (MoM). The MoM estimators are compared with the maximum-likelihood estimators (MLE), using simulation. The authors find that the MoM can improve the estimation in terms of mean-square error and bias, especially under circumstances where the MLE method is not accurate or cannot provide a solution.
AB - Measurements are sometimes affected by excessively large round-off errors. Small rounding-off may safely be ignored for purposes of statistical inference however large rounding-off may have an effect. The importance of the round-off (δ) is determined by the ratio between the standard deviation s and the instrument's scale step h, δ = σ/h. In this study, the authors estimate σ when δ is small (δ < 0.5) using a variant of the method of moments (MoM). The MoM estimators are compared with the maximum-likelihood estimators (MLE), using simulation. The authors find that the MoM can improve the estimation in terms of mean-square error and bias, especially under circumstances where the MLE method is not accurate or cannot provide a solution.
UR - http://www.scopus.com/inward/record.url?scp=84880651719&partnerID=8YFLogxK
U2 - 10.1049/iet-smt.2012.0031
DO - 10.1049/iet-smt.2012.0031
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AN - SCOPUS:84880651719
SN - 1751-8822
VL - 7
SP - 180
EP - 189
JO - IET Science, Measurement and Technology
JF - IET Science, Measurement and Technology
IS - 3
ER -