Constructing a reliable test&set bit

Frank Stomp; Gadi Taubenfeld

doi:10.1145/248052.248085

Constructing a reliable test&set bit

Frank Stomp
, Gadi Taubenfeld

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.

Original language	English
Title of host publication	PODC 1996
Subtitle of host publication	Proceedings of the fifteenth annual ACM symposium on Principles of distributed computing
Publisher	ACM
Pages	177
Number of pages	1
ISBN (Print)	9780897918008
DOIs	https://doi.org/10.1145/248052.248085
State	Published - 1 May 1996
Externally published	Yes
Event	15th Annual ACM Symposium on Principles of Distributed Computing, PODC 1996 - Philadelphia, PA, USA Duration: 23 May 1996 → 26 May 1996

Publication series

Name	Proceedings of the Annual ACM Symposium on Principles of Distributed Computing

Conference

Conference	15th Annual ACM Symposium on Principles of Distributed Computing, PODC 1996
City	Philadelphia, PA, USA
Period	23/05/96 → 26/05/96

Access to Document

10.1145/248052.248085

Cite this

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title = "Constructing a reliable test\&set bit",

abstract = "A reliable test\&set bit is constructed from a collection of test\&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test\&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test\&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test\&set bit without a reset operation into one which supports a reset.",

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series = "Proceedings of the Annual ACM Symposium on Principles of Distributed Computing",

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Stomp, F & Taubenfeld, G 1996, Constructing a reliable test&set bit. in PODC 1996: Proceedings of the fifteenth annual ACM symposium on Principles of distributed computing. Proceedings of the Annual ACM Symposium on Principles of Distributed Computing, ACM, pp. 177, 15th Annual ACM Symposium on Principles of Distributed Computing, PODC 1996, Philadelphia, PA, USA, 23/05/96. https://doi.org/10.1145/248052.248085

Constructing a reliable test&set bit. / Stomp, Frank; Taubenfeld, Gadi.
PODC 1996: Proceedings of the fifteenth annual ACM symposium on Principles of distributed computing. ACM, 1996. p. 177 (Proceedings of the Annual ACM Symposium on Principles of Distributed Computing).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Constructing a reliable test&set bit

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