Constructing a reliable test&set bit

Frank Stomp, Gadi Taubenfeld

Research output: Contribution to conferencePaperpeer-review

Abstract

A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.

Original languageEnglish
Pages177
Number of pages1
DOIs
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing - Philadelphia, PA, USA
Duration: 23 May 199626 May 1996

Conference

ConferenceProceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing
CityPhiladelphia, PA, USA
Period23/05/9626/05/96

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