Constructing a reliable test&set bit

Frank Stomp; Gadi Taubenfeld

doi:10.1145/248052.248085

Constructing a reliable test&set bit

Frank Stomp, Gadi Taubenfeld

Research output: Contribution to conference › Paper › peer-review

Abstract

A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.

Original language	English
Pages	177
Number of pages	1
DOIs	https://doi.org/10.1145/248052.248085
State	Published - 1996
Externally published	Yes
Event	Proceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing - Philadelphia, PA, USA Duration: 23 May 1996 → 26 May 1996

Conference

Conference	Proceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing
City	Philadelphia, PA, USA
Period	23/05/96 → 26/05/96

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10.1145/248052.248085

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Constructing a reliable test&set bit

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