AllSAT for Combinational Circuits

Dror Fried, Alexander Nadel, Yogev Shalmon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Motivated by the need to improve the scalability of Intel's in-house Static Timing Analysis (STA) tool, we consider the problem of enumerating all the solutions of a single-output combinational Boolean circuit, called AllSAT-CT. While AllSAT-CT is immediately reducible to enumerating the solutions of a Boolean formula in Conjunctive Normal Form (AllSAT-CNF), our experiments had shown that such a reduction, followed by applying state-of-The-Art AllSAT-CNF tools, does not scale well on neither our industrial AllSAT-CT instances nor generic circuits, both when the user requires the solutions to be disjoint or when they can be non-disjoint. We focused on understanding the reasons for this phenomenon for the well-known iterative blocking family of AllSAT-CNF algorithms. We realized that existing blocking AllSAT-CNF algorithms fail to generalize efficiently for AllSAT-CT, since they are restricted to Boolean logic. Consequently, we introduce three dedicated AllSAT-CT algorithms that are ternary-logic-Aware: A ternary simulation-based algorithm TALE, a dual-rail&MaxSAT-based algorithm MARS, and their combination. Specifically, we introduce in MARS two novel blocking clause generation approaches for the disjoint and non-disjoint cases. We implemented our algorithms in our new tool HALL. We show that HALL scales substantially better than any reduction to existing AllSAT-CNF tools on our industrial STA instances as well as on publicly available families of combinational circuits for both the disjoint and the non-disjoint cases.

Original languageEnglish
Title of host publication26th International Conference on Theory and Applications of Satisfiability Testing, SAT 2023
EditorsMeena Mahajan, Friedrich Slivovsky
PublisherSchloss Dagstuhl- Leibniz-Zentrum fur Informatik GmbH, Dagstuhl Publishing
Pages9:1-9:18
Number of pages18
ISBN (Electronic)9783959772860
DOIs
StatePublished - Aug 2023
Event26th International Conference on Theory and Applications of Satisfiability Testing, SAT 2023 - Alghero, Italy
Duration: 4 Jul 20238 Jul 2023

Publication series

NameLeibniz International Proceedings in Informatics, LIPIcs
Volume271
ISSN (Print)1868-8969

Conference

Conference26th International Conference on Theory and Applications of Satisfiability Testing, SAT 2023
Country/TerritoryItaly
CityAlghero
Period4/07/238/07/23

Bibliographical note

Funding Information:
Funding Yogev Shalmon: This research was partially supported by The Open University of Israel’s Research Fund (grant no. 41662).

Publisher Copyright:
© 2023 Schloss Dagstuhl- Leibniz-Zentrum fur Informatik GmbH, Dagstuhl Publishing. All rights reserved.

DBLP License: DBLP's bibliographic metadata records provided through http://dblp.org/ are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.

Keywords

  • AllSAT
  • Circuits
  • SAT

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