Wide baseline stereo matching with convex bounded distortion constraints

Meirav Galun, Tal Amir, Tal Hassner, Ronen Basri, Yaron Lipman

نتاج البحث: فصل من :كتاب / تقرير / مؤتمرمنشور من مؤتمرمراجعة النظراء

ملخص

Finding correspondences in wide baseline setups is a challenging problem. Existing approaches have focused largely on developing better feature descriptors for correspondence and on accurate recovery of epipolar line constraints. This paper focuses on the challenging problem of finding correspondences once approximate epipolar constraints are given. We introduce a novel method that integrates a deformation model. Specifically, we formulate the problem as finding the largest number of corresponding points related by a bounded distortion map that obeys the given epipolar constraints. We show that, while the set of bounded distortion maps is not convex, the subset of maps that obey the epipolar line constraints is convex, allowing us to introduce an efficient algorithm for matching. We further utilize a robust cost function for matching and employ majorization-minimization for its optimization. Our experiments indicate that our method finds significantly more accurate maps than existing approaches.

اللغة الأصليةالإنجليزيّة
عنوان منشور المضيف2015 International Conference on Computer Vision, ICCV 2015
ناشرInstitute of Electrical and Electronics Engineers Inc.
الصفحات2228-2236
عدد الصفحات9
رقم المعيار الدولي للكتب (الإلكتروني)9781467383912
المعرِّفات الرقمية للأشياء
حالة النشرنُشِر - 17 فبراير 2015
الحدث15th IEEE International Conference on Computer Vision, ICCV 2015 - Santiago, تشيلي
المدة: ١١ ديسمبر ٢٠١٥١٨ ديسمبر ٢٠١٥

سلسلة المنشورات

الاسمProceedings of the IEEE International Conference on Computer Vision
مستوى الصوت2015 International Conference on Computer Vision, ICCV 2015
رقم المعيار الدولي للدوريات (المطبوع)1550-5499

!!Conference

!!Conference15th IEEE International Conference on Computer Vision, ICCV 2015
الدولة/الإقليمتشيلي
المدينةSantiago
المدة١١/١٢/١٥١٨/١٢/١٥

ملاحظة ببليوغرافية

Publisher Copyright:
© 2015 IEEE.

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