Segmentation of the expected duration of maintenance activities in semiconductor fabs

نتاج البحث: فصل من :كتاب / تقرير / مؤتمرمنشور من مؤتمرمراجعة النظراء

ملخص

The duration and execution of preventive maintenance (PM) activities have a significant impact on maintaining effective control over factory equipment while ensuring that it is healthy and available for production. Although most PMs in the industry have similar structures, the task of generating an automated segmented view of the PM duration and flow to highlight inefficiencies and corresponding opportunities for improvement is complicated by a reliance on manual data entries made by human operators. In addition, most optimization and analysis models treat a PM as a single activity while ignoring its parts. In this paper, a model is proposed to generically segment a PM into its parts and define the expected PM duration. The segmentation, done automatically by sequencing the lots run on the tool, results in a clear overview of time losses in the PM and of opportunities for improvement.

اللغة الأصليةالإنجليزيّة
عنوان منشور المضيف2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015
ناشرInstitute of Electrical and Electronics Engineers Inc.
الصفحات280-285
عدد الصفحات6
رقم المعيار الدولي للكتب (الإلكتروني)9781479999309
المعرِّفات الرقمية للأشياء
حالة النشرنُشِر - 22 يوليو 2015
الحدث26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015 - Saratoga Springs, الولايات المتّحدة
المدة: ٣ مايو ٢٠١٥٦ مايو ٢٠١٥

سلسلة المنشورات

الاسم2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015

!!Conference

!!Conference26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015
الدولة/الإقليمالولايات المتّحدة
المدينةSaratoga Springs
المدة٣/٠٥/١٥٦/٠٥/١٥

ملاحظة ببليوغرافية

Publisher Copyright:
© 2015 IEEE.

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