TY - GEN
T1 - Constructing a reliable test&set bit
AU - Stomp, Frank
AU - Taubenfeld, Gadi
PY - 1996/5/1
Y1 - 1996/5/1
N2 - A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.
AB - A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.
UR - https://www.scopus.com/pages/publications/0029712067
U2 - 10.1145/248052.248085
DO - 10.1145/248052.248085
M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???
AN - SCOPUS:0029712067
SN - 9780897918008
T3 - Proceedings of the Annual ACM Symposium on Principles of Distributed Computing
SP - 177
BT - PODC 1996
PB - ACM
T2 - 15th Annual ACM Symposium on Principles of Distributed Computing, PODC 1996
Y2 - 23 May 1996 through 26 May 1996
ER -