ملخص
A reliable test&set bit is constructed from a collection of test&set bits of which some may be faulty. Faults, called omission faults, are modeled by allowing operations on the faulty bits to return a special distinguished value. The test&set bits are studied without a reset operation which can tolerate one omission fault only. There exist a general technique t faults from test&set bits which can tolerate only one fault. Also, there exists a general technique to convert a test&set bit without a reset operation into one which supports a reset.
اللغة الأصلية | الإنجليزيّة |
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الصفحات | 177 |
عدد الصفحات | 1 |
المعرِّفات الرقمية للأشياء | |
حالة النشر | نُشِر - 1996 |
منشور خارجيًا | نعم |
الحدث | Proceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing - Philadelphia, PA, USA المدة: ٢٣ مايو ١٩٩٦ → ٢٦ مايو ١٩٩٦ |
!!Conference
!!Conference | Proceedings of the 1996 15th Annual ACM Symposium on Principles of Distributed Computing |
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المدينة | Philadelphia, PA, USA |
المدة | ٢٣/٠٥/٩٦ → ٢٦/٠٥/٩٦ |